Page 8 - Issue 13
P. 8

'Serious challenges' for metrology in the new world of additive manufacturing
Additive Manufacturing (AM) technologies in manufacturing are bringing with them some serious metrology challenges, a first GTMA meeting of the year heard.
This is because of a side effect of the manufacturing process and the ability to design in features that cannot be accessed using traditional measurement processes.
In particular, internal features can be produced that can currently only be accessed using X-ray Computed Tomography (XCT) which is both expensive and unavailable to smaller companies.
Also, issues around the
surface properties of parts
means traditional meas-
urement techniques are
often unsuitable. These
issues were among those
covered when GTMA held
a metrology sector meet-
ing with GTMA supplier
the National Physical Laboratory (NPL) on January 14 in Huddersfield on 'Metrology for Additive Manufacturing.'
The turnout showed support for the GTMA's new Technology Focus with numbers attending higher than anticipated. Delegates left the meeting with a better understanding about metrology for AM and a desire for a follow up meeting.
There were short presentations from four organisations involved in AM and a tour of the AM facilities in the 3M Buckley Innovation Centre, Huddersfield University, which hosted the meeting.
The tour of 3M BIC's additive manufacturing capabilities included two Renishaw metal AM machines, a host of polymer AM machines, the 3M BIC Zeiss inspection suite and the Nikon XCT. Delegates were also introduced to the NPL laboratories and capabilities.
The presentations were:
• 3M BIC (Dr Michael Wilson) on 'AM processes'
• MTC (David Ross-Pinnock) 'Product verification challenges for com-
ponents manufactured by additive manufacturing’
• NPL (Peter Woolliams) 'Current status of standards in AM'
• Liverpool John Moore's University (Dr Sam Tammas-Williams)
'Correlating Manufacturing strategies to material properties.'
The final part of the meeting was a round table discussion about chal- lenges in AM and AM part validation. Among key issues raised were:
• The need for more AM training
• The difference in mindset and training needs for 'Design for AM'
• The major challenges in part validation for both internal and external
After the meeting many of the delegates attended an NPL Manufacturer Measurement Network meeting on Additive Manufacturing.
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