Bruker’s new Contour LS-K 3D Optical Profiler utilizes LightSpeed™ focus variation technology to uniquely enable both high-resolution images and quantifiable data. The system rapidly captures surface data with a large field of view (FOV) at vertical scanning speeds up to 5 millimeters per second. Data-rich images are displayed in high-resolution and in real color within seconds.
From the first patents issued for Wyko® white light interferometry over 30 years ago to the very latest innovations in optical profiling, Bruker technology has a worldwide reputation as the gold standard in surface metrology performance. Contour LS-K capitalizes on this rich heritage to provide easy access to raw measurement data, allowing the operator to see exactly what is on the surface without filtering or data modification.